Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.

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The values in the seventh column were summed to give the total intercept length for this evaluation Users easily set calibration, choose preparation options and set the desired measurement method. However, the test methods described here for area fraction estimation may be of use in describing duplex grain structures.

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Measures grain boundary intercept distances or individual grain areas. However, these steels e1811 also exhibit a bimodal grain size condition solely within the ferrite grain structure. If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire crosssection as well.

Examples of random duplex grain sizes include: E — 02 The test methods provide for reporting of specic, distinctive information for w1181 type of duplex grain size. Apply this procedure to projected images from a microscope, or to photomicrographs. The area occupied by the ne grains is what must be determined. Estimate the area fraction for the grain size region being evaluated as the number of grid points falling within the region, divided by the total number of grid points that lie within the total image outline the grid must be large enough to completely cover the total image.

### ASTM E – 02() Standard Test Methods for Characterizing Duplex Grain Sizes

An example photomicrograph of the banding condition appears in Fig. For the coarse grain, the corresponding intercept length of Use the “Duplex” button to start the programs designed to calculate duplex grain sizes.

The grain size and area fraction values shown in a given report format correspond to the appearance of the photomicrograph shown. The software provides fast and accurate detection of grain boundaries or grain face areas.

Follow this aztm for each grain in turn along one grid line, and repeat the process for each grid line.

aatm The operator may edit individual images allowing accurate measurements to be made even on difficult samples. Further suppose that measurements indicate an average depth of that surface layer of 1. A d1181 whose wall thickness is small compared to its outside diameter may be treated as equivalent to a product of rectangular cross-section, in that a surface layer of atsm given depth at 5 the outside diameter covers essentially the same area as a layer of the same depth at the inside diameter.

Use of the grid is described in Methods E Examples of random duplex grain sizes include: Examples of topological duplex grain sizes include: Such outlining will simplify decisions during point counting, and thus speed the counting process. If the specimen being examined is the full cross-section of a round bar, the longitudinal section should not be used to estimate the area fraction occupied by different grain sizes.

The distribution of intercept lengths is much more efficiently determined using a semi-automated image analysis system with a digitizing tablet and electronic pencil or cursor, or using an automated image analysis system with electronic pencil or cursor. It is the responsibility of the user of this standard to consult appropriate safety and health practices and determine the applicability of regulatory limitations prior to its use.

Selecting only part of the specimen surface may inadvertently eliminate areas that have high or low concentrations of one of the grain sizes, thus biasing the estimate. Your comments are invited either for revision of this standard or for additional standards and should be addressed to ASTM International Headquarters. An arbitrary division was made between the two distinct distributions of grain sizes.

The grid spacing should be matched to the image magnication to fulll the recommendations of Practice E For the ne grain, the total intercept length If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire cross-section as well.

This standard does not purport to address all of the safety concerns associated with its use. For the coarse grain size, the number of intercepts totaled 13, and the intercept length totaled Referenced Documents purchase separately The documents listed below are referenced within the subject standard but are e1811 provided as part of the standard.

E — 02 FIG. Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such are not the subject of these methods. Grain Size Control Panel: Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such asstm not the subject of these methods. Practice E FIG.

The histogram suggests that the specimen evaluated contains more than a single distribution of grain sizes. The test grid consists of a series of ne, parallel lines, with an interline spacing of 5 mm. The area of each of those regions is then measured by tracing its outline with the planimeter.

Use Methods E to determine the average size of the balance of the grains in the specimen. Accumulated grain size statistics are displayed in the “Statistics” box. Presentation of the data as a histogram or a frequency plot is also shown. The values from this calculation were entered in the seventh column of Table X2.

The test methods separate duplex grain sizes into one of two distinct classes, then into specific types within atm classes, and provide systems for grain size characterization of each type. This comparison chart is shown in Fig.

For a tubular product, estimates of area fractions made on longitudinal sections are reasonable approximations of the same estimates made on transverse sections.